3-3: Influence of Vacuum Chamber Impurities on OLED...

SID Symposium Digest of Technical Papers 2017 / 05 Vol. 48; Iss. 1

3-3: Influence of Vacuum Chamber Impurities on OLED Degradation

Fujimoto, Hiroshi, Suekane, Takashi, Imanishi, Katsuya, Yukiwaki, Satoshi, Wei, Hong, Nagayoshi, Kaori, Yahiro, Masayuki, Adachi, Chihaya
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Volume:
48
Language:
english
Journal:
SID Symposium Digest of Technical Papers
DOI:
10.1002/sdtp.11560
Date:
May, 2017
File:
PDF, 1.37 MB
english, 2017
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