The CiOi(SiI)2defect in silicon: density functional theory calculations
Christopoulos, S.-R. G., Sgourou, E. N., Angeletos, T., Vovk, R. V., Chroneos, A., Londos, C. A.Volume:
28
Language:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-017-6797-6
Date:
July, 2017
File:
PDF, 711 KB
english, 2017