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Structural, optical and ellipsometric characteristics of PVD synthesized SnO2 thin films on Pt coated silicon wafers
Howari, H., Tomsah, I.B.I.Language:
english
Journal:
Optik - International Journal for Light and Electron Optics
DOI:
10.1016/j.ijleo.2017.05.098
Date:
June, 2017
File:
PDF, 933 KB
english, 2017