Integrated Cryogenic Electronics Testbed (ICE-T) for...

IOP Conference Series Materials Science and Engineering 2017 / 02 Vol. 171

Integrated Cryogenic Electronics Testbed (ICE-T) for Evaluation of Superconductor and Cryo-Semiconductor Integrated Circuits

Dotsenko, V. V., Sahu, A., Chonigman, B., Tang, J., Lehmann, A. E., Gupta, V., Talalevskii, A., Ruotolo, S., Sarwana, S., Webber, R. J., Gupta, D.
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Volume:
171
Language:
english
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/171/1/012145
Date:
February, 2017
File:
PDF, 1.10 MB
english, 2017
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