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[IEEE 2017 IEEE 33rd International Conference on Data Engineering (ICDE) - San Diego, CA, USA (2017.4.19-2017.4.22)] 2017 IEEE 33rd International Conference on Data Engineering (ICDE) - The Good, the Bad, and the KPIs: How to Combine Performance Metrics to Better Capture Underperforming Sectors in Mobile Networks
Leontiadis, Ilias, Serra, Joan, Finamore, Alessandro, Dimopoulos, Giorgos, Papagiannaki, KonstantinaYear:
2017
Language:
english
DOI:
10.1109/ICDE.2017.89
File:
PDF, 1.54 MB
english, 2017