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[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - Comparison of DC and AC NBTI kinetics in RMG Si and SiGe p-FinFETs
Parihar, Narendra, Southwick, Richard G., Sharma, Uma, Wang, Miaomiao, Stathis, James H, Mahapatra, SouvikYear:
2017
Language:
english
DOI:
10.1109/IRPS.2017.7936264
File:
PDF, 318 KB
english, 2017