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[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - A simulation study on residual thermal stresses in high power GaN LEDs
Ankit, Bindhya Raj, Dhakad, Bhupendra Singh, Chatterjee, Amitabh, Dixit, Uday ShankerYear:
2017
Language:
english
DOI:
10.1109/IRPS.2017.7936382
File:
PDF, 770 KB
english, 2017