Laser-preparation of geometrically optimised samples for X-ray nano-CT
BAILEY, J.J., HEENAN, T.M.M., FINEGAN, D.P., LU, X., DAEMI, S.R., IACOVIELLO, F., BACKEBERG, N.R., TAIWO, O.O., BRETT, D.J.L., ATKINSON, A., SHEARING, P.R.Language:
english
Journal:
Journal of Microscopy
DOI:
10.1111/jmi.12577
Date:
May, 2017
File:
PDF, 6.38 MB
english, 2017