[ASME ASME 2011 International Mechanical Engineering Congress and Exposition - Denver, Colorado, USA (November 11–17, 2011)] Volume 11: Nano and Micro Materials, Devices and Systems; Microsystems Integration - Low-Frequency Electrical Noise Thermometry for Micro- and Nano-Scale Devices
Sayer, Robert A., Engerer, Jeffrey D., Sen, Sudeshna, Vidhyadhiraja, N. S., Fisher, Timothy S.Year:
2011
Language:
english
DOI:
10.1115/imece2011-63586
File:
PDF, 941 KB
english, 2011