![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE 2nd international Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - A pretreatment method of identifying infrared target using FPGA
Yang, Li, Zhang, Chuang, Bai, Lianfa, Wen, Shangming, Chen, Yaolong, Qian, Weixian, Kley, Ernst-BernhardVolume:
6149
Year:
2005
Language:
english
DOI:
10.1117/12.674354
File:
PDF, 288 KB
english, 2005