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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida, United States (Monday 25 April 2011)] Thermosense: Thermal Infrared Applications XXXIII - Comparative analysis of pulse and active thermography for investigating solder joint geometry prediction
Vela, Becky M., Safai, Morteza, Brown, Jeff R., Hsieh, Sheng-Jen, Girón Palomares, José Benjamín DoloresVolume:
8013
Year:
2011
Language:
english
DOI:
10.1117/12.883754
File:
PDF, 49.33 MB
english, 2011