![](/img/cover-not-exists.png)
X-ray analysis of multilayer In0.52Al0.48As/In0.53Ga0.47As/In0.52Al0.48As HEMT heterostructures with InAs nanoinsert in quantum well
Blagov, A. E., Galiev, G. B., Imamov, R. M., Klimov, E. A., Kondratev, O. A., Pisarevskii, Yu. V., Prosekov, P. A., Pushkarev, S. S., Seregin, A. Yu., Koval’chuk, M. V.Volume:
62
Language:
english
Journal:
Crystallography Reports
DOI:
10.1134/S1063774517030026
Date:
May, 2017
File:
PDF, 545 KB
english, 2017