X-ray analysis of multilayer...

Crystallography Reports 2017 / 5 Vol. 62; Iss. 3

X-ray analysis of multilayer In0.52Al0.48As/In0.53Ga0.47As/In0.52Al0.48As HEMT heterostructures with InAs nanoinsert in quantum well

Blagov, A. E., Galiev, G. B., Imamov, R. M., Klimov, E. A., Kondratev, O. A., Pisarevskii, Yu. V., Prosekov, P. A., Pushkarev, S. S., Seregin, A. Yu., Koval’chuk, M. V.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
62
Language:
english
Journal:
Crystallography Reports
DOI:
10.1134/S1063774517030026
Date:
May, 2017
File:
PDF, 545 KB
english, 2017
Conversion to is in progress
Conversion to is failed