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Effect of gate-dielectrics on the electrical characteristics of solution-processed single-wall-carbon-nanotube thin-film transistors
Ha, Tae-JunVolume:
13
Language:
english
Journal:
Electronic Materials Letters
DOI:
10.1007/s13391-017-7005-9
Date:
July, 2017
File:
PDF, 1.95 MB
english, 2017