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[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - Soft error rate analysis for incident angle and N-well structure dependencies using small-sized alpha source in 10nm FinFET technology
Lee, Soonyoung, Uemura, Taiki, Monga, Udit, Choi, Jae Hee, Kim, GunRae, Pae, SangwooYear:
2017
Language:
english
DOI:
10.1109/IRPS.2017.7936402
File:
PDF, 842 KB
english, 2017