[IEEE 2017 International Symposium on VLSI Design,...

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[IEEE 2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2017.4.24-2017.4.27)] 2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Highly integrated RF frontend module for high SHF wide-band massive MIMO in 5G, and switching-mode amplifiers beyond 4G

Shinjo, Shintaro, Nakatani, Keigo, Kamioka, Jun, Komaru, Ryota, Sakata, Shuichi, Fujiwara, Takanobu, Nakamizo, Hideyuki, Yamanaka, Koji
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Year:
2017
Language:
english
DOI:
10.1109/VLSI-DAT.2017.7939651
File:
PDF, 699 KB
english, 2017
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