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[IEEE 2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2017.4.24-2017.4.27)] 2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - A current feedback instrumentation amplifier with chopping and dynamic element matching techniques and employing the current-reuse technique in input/feedback stages
Chen, Tzu-Ying, Tsai, Yi-Lin, Lin, Tsung-HsienYear:
2017
Language:
english
DOI:
10.1109/VLSI-DAT.2017.7939666
File:
PDF, 713 KB
english, 2017