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Atomic mapping of structural distortions in 109° domain patterned BiFeO3 thin films
Wang, Wen-Yuan, Zhu, Yin-Lian, Tang, Yun-Long, Han, Meng-Jiao, Wang, Yu-Jia, Ma, Xiu-LiangLanguage:
english
Journal:
Journal of Materials Research
DOI:
10.1557/jmr.2017.206
Date:
June, 2017
File:
PDF, 623 KB
english, 2017