Analysis of Reliability of Spectral Water Vapor Line Parameters at High Temperatures in Spectroscopic Databases
Voitsekhovskaya, O. K., Egorov, O. V., Kashirskii, D. E.Volume:
60
Language:
english
Journal:
Russian Physics Journal
DOI:
10.1007/s11182-017-1070-2
Date:
June, 2017
File:
PDF, 467 KB
english, 2017