Analysis of Reliability of Spectral Water Vapor Line...

Analysis of Reliability of Spectral Water Vapor Line Parameters at High Temperatures in Spectroscopic Databases

Voitsekhovskaya, O. K., Egorov, O. V., Kashirskii, D. E.
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Volume:
60
Language:
english
Journal:
Russian Physics Journal
DOI:
10.1007/s11182-017-1070-2
Date:
June, 2017
File:
PDF, 467 KB
english, 2017
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