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Microelectronics Reliability 2017 / 6

Electrical characterization and reliability of submicron SOI CMOS technology in the extended temperature range (to 300 °C)

Petrosyants, Konstantin O., Kharitonov, Igor A., Lebedev, Sergey V., Sambursky, Lev M., Safonov, Sergey O., Stakhin, Veniamin G.
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Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.05.018
Date:
June, 2017
File:
PDF, 3.04 MB
english, 2017
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