[IEEE 2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2017.4.24-2017.4.27)] 2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hybrid spiking-stochastic Deep Neural Network
Kim, Heesu, Yu, Joonsang, Choi, KiyoungYear:
2017
Language:
english
DOI:
10.1109/VLSI-DAT.2017.7939642
File:
PDF, 692 KB
english, 2017