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[IEEE 2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2017.4.24-2017.4.27)] 2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hybrid spiking-stochastic Deep Neural Network

Kim, Heesu, Yu, Joonsang, Choi, Kiyoung
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Year:
2017
Language:
english
DOI:
10.1109/VLSI-DAT.2017.7939642
File:
PDF, 692 KB
english, 2017
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