The stability of tin silicon oxide thin-film transistors...

EPL (Europhysics Letters) 2016 / 07 Vol. 115; Iss. 2

The stability of tin silicon oxide thin-film transistors with different annealing temperatures

Yang, Jianwen, Fu, Ruofan, Han, Yanbing, Meng, Ting, Zhang, Qun
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
115
Language:
english
Journal:
EPL (Europhysics Letters)
DOI:
10.1209/0295-5075/115/28006
Date:
July, 2016
File:
PDF, 1.46 MB
english, 2016
Conversion to is in progress
Conversion to is failed