[IEEE 2017 IEEE North Atlantic Test Workshop (NATW) -...

  • Main
  • [IEEE 2017 IEEE North Atlantic Test...

[IEEE 2017 IEEE North Atlantic Test Workshop (NATW) - Providence, RI, USA (2017.5.8-2017.5.10)] 2017 IEEE North Atlantic Test Workshop (NATW) - An enhanced approach to reduce test application time through limited shift operations in scan chains

Poulos, Konstantinos, Kuchi, Jayasurya, Haniotakis, Themistoklis
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2017
Language:
english
DOI:
10.1109/NATW.2017.7938026
File:
PDF, 665 KB
english, 2017
Conversion to is in progress
Conversion to is failed