[IEEE 2017 IEEE North Atlantic Test Workshop (NATW) - Providence, RI, USA (2017.5.8-2017.5.10)] 2017 IEEE North Atlantic Test Workshop (NATW) - An enhanced approach to reduce test application time through limited shift operations in scan chains
Poulos, Konstantinos, Kuchi, Jayasurya, Haniotakis, ThemistoklisYear:
2017
Language:
english
DOI:
10.1109/NATW.2017.7938026
File:
PDF, 665 KB
english, 2017