SPIE Proceedings [SPIE SPIE Defense + Security - Anaheim, California, United States (Sunday 9 April 2017)] Infrared Technology and Applications XLIII - An 80x80 microbolometer type thermal imaging sensor using the LWIR-band CMOS infrared (CIR) technology
Andresen, Bjørn F., Fulop, Gabor F., Hanson, Charles M., Miller, John L., Norton, Paul R., Tankut, Firat, Cologlu, Mustafa H., Askar, Hidir, Ozturk, Hande, Dumanli, Hilal K., Oruc, Feyza, Tilkioglu, BVolume:
10177
Year:
2017
Language:
english
DOI:
10.1117/12.2275161
File:
PDF, 1.84 MB
english, 2017