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Microelectronics Reliability 2017 / 6

Physically-based evaluation of aging contributions in HC/FN-programmed 40 nm NOR Flash technology

Torrente, Giulio, Coignus, Jean, Vernhet, Alexandre, Ogier, Jean-Luc, Roy, David, Ghibaudo, Gérard
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Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.05.039
Date:
June, 2017
File:
PDF, 2.25 MB
english, 2017
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