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Atomic Scale Structural Characterization of Epitaxial (Cd,Cr)Te Magnetic Semiconductor
Bonef, Bastien, Boukari, Hervé, Grenier, Adeline, Mouton, Isabelle, Jouneau, Pierre-Henri, Kinjo, Hidekazu, Kuroda, ShinjiLanguage:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927617000642
Date:
June, 2017
File:
PDF, 835 KB
english, 2017