[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - Investigation of hot carrier degradation in bulk FinFET
Chung, Eun-Ae, Nam, Kab-Jin, Nakanishi, Toshiro, Park, Sungil, Yang, Hongseon, Kauerauf, Thomas, Jiao, Guangfan, Kim, Dong-won, Hwang, Ki Hyun, Kim, Hyejin, Lee, Hyunwoo, Pae, SangwooYear:
2017
Language:
english
DOI:
10.1109/IRPS.2017.7936420
File:
PDF, 649 KB
english, 2017