SPIE Proceedings [SPIE SPIE Commercial + Scientific Sensing and Imaging - Anaheim, California, United States (Sunday 9 April 2017)] Advanced Photon Counting Techniques XI - X-ray backscatter sensing of defects in carbon fibre composite materials
Itzler, Mark A., Campbell, Joe C., O'Flynn, Daniel, Crews, Chiaki, Fox, Nicholas, Allen, Brian P., Sammons, Mark, Speller, Robert D.Volume:
10212
Year:
2017
Language:
english
DOI:
10.1117/12.2262581
File:
PDF, 692 KB
english, 2017