[IEEE 2017 IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2017.5.14-2017.5.17)] 2017 IEEE International Memory Workshop (IMW) - High-Temperature Stable Physical Unclonable Functions with Error-Free Readout Scheme Based on 28nm SG-MONOS Flash Memory for Security Applications
Saito, Tomoya, Nagase, Hirokazu, Izuna, Masayuki, Shimoi, Takahiro, Kanda, Akihiko, Ito, Takashi, Kono, TakashiYear:
2017
Language:
english
DOI:
10.1109/IMW.2017.7939086
File:
PDF, 326 KB
english, 2017