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[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - CPI advancement in integrated fan-out (InFO) technology
Yu, Douglas, Yeh, John, Lin, Tsung-Shu, Yee, K CYear:
2017
Language:
english
DOI:
10.1109/IRPS.2017.7936301
File:
PDF, 738 KB
english, 2017