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[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - PBTI and PBTS testing of 0.25 μm pMOSFET devices for analog circuits
Hall, Gavin, Myers, Tracy, Ou, Lancelot, Slezak, Jiri, Litschmann, Ales, Price, David, Clear, Troy, Gambino, JeffYear:
2017
Language:
english
DOI:
10.1109/IRPS.2017.7936401
File:
PDF, 1.10 MB
english, 2017