Numerical Investigations of a Silicon Photonic TE-Pass Polarizer Consisting of Alternating Copper/Silicon Nitride Layers
Chen, Lei, Ye, Han, Liu, Yumin, Wu, Dong, Ma, Rui, Yu, ZhongyuanVolume:
9
Language:
english
Journal:
IEEE Photonics Journal
DOI:
10.1109/JPHOT.2017.2679763
Date:
April, 2017
File:
PDF, 829 KB
english, 2017