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[ACM Press the 2017 ACM SIGMETRICS / International Conference - Urbana-Champaign, Illinois, USA (2017.06.05-2017.06.09)] Proceedings of the 2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems - SIGMETRICS '17 Abstracts - ECF
Lim, Yeon-sup, Nahum, Erich M., Towsley, Don, Gibbens, Richard J.Year:
2017
Language:
english
DOI:
10.1145/3078505.3078552
File:
PDF, 1.08 MB
english, 2017