Reliability enhancement due to in-situ post-oxidation of...

Reliability enhancement due to in-situ post-oxidation of sputtered MgO barrier in double MgO barrier magnetic tunnel junction

Yoshida, Chikako, Noshiro, Hideyuki, Yamazaki, Yuichi, Sugii, Toshihiro
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Volume:
7
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4985300
Date:
June, 2017
File:
PDF, 9.28 MB
english, 2017
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