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[IEEE 2017 IEEE Aerospace Conference - Big Sky, MT, USA (2017.3.4-2017.3.11)] 2017 IEEE Aerospace Conference - Frequency smearing in full 3D interferometry
van Vugt, Pieter, Wijnholds, Stefan, Meijerink, Arjan, Bentum, MarkYear:
2017
Language:
english
DOI:
10.1109/AERO.2017.7943770
File:
PDF, 713 KB
english, 2017