![](/img/cover-not-exists.png)
[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - Transient out-of-SOA robustness of SiC power MOSFETs
Castellazzi, Alberto, Fayyaz, Asad, Romano, Gianpaolo, Riccio, Michele, Irace, Andrea, Urresti-Ibanez, Jesus, Wright, NickYear:
2017
DOI:
10.1109/IRPS.2017.7936255
File:
PDF, 1.29 MB
2017