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[IEEE 2017 IEEE 8th Latin American Symposium on Circuits & Systems (LASCAS) - Bariloche, Argentina (2017.2.20-2017.2.23)] 2017 IEEE 8th Latin American Symposium on Circuits & Systems (LASCAS) - Key note: Integrated design-for-reliability for ICs

Wang, Albert, Lu, Fei, Chen, Qi, Wang, Chenkun, Li, Cheng, Zhang, Feilong
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Year:
2017
Language:
english
DOI:
10.1109/LASCAS.2017.7948037
File:
PDF, 5.38 MB
english, 2017
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