Rapid Evaluation of Electron Mobilities at Semiconductor–Insulator Interfaces in an Ambient Atmosphere by a Contactless Microwave-Based Technique
Inoue, Junichi, Tsutsui, Yusuke, Choi, Wookjin, Kubota, Kai, Sakurai, Tsuneaki, Seki, ShuVolume:
2
Language:
english
Journal:
ACS Omega
DOI:
10.1021/acsomega.6b00428
Date:
January, 2017
File:
PDF, 3.17 MB
english, 2017