A 65-nm CMOS Wideband TDD Front-End With Integrated T/R Switching via PA Re-Use
Xiao, Xiao, Pratt, Amanda, Yang, Bonjern, Wang, Angie, Niknejad, Ali M., Alon, Elad, Nikolic, BorivojeYear:
2017
Language:
english
Journal:
IEEE Journal of Solid-State Circuits
DOI:
10.1109/JSSC.2017.2702669
File:
PDF, 5.54 MB
english, 2017