[IEEE 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2016.7.18-2016.7.21)] 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Case study of leakage/short on PCB after biased-HAST
Lin, Ke-Ying, Chen, SharonYear:
2016
DOI:
10.1109/ipfa.2016.7564262
File:
PDF, 468 KB
2016