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[IEEE 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2016.7.18-2016.7.21)] 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - The application of pulse IV function in nano-prober system
Lee, Yu Te, Pan, Jeng Hung, Huang, Zenniss, Liu, Shih Yuan, Chang, Yu Pang, Lin, Jian ChangYear:
2016
DOI:
10.1109/ipfa.2016.7564289
File:
PDF, 246 KB
2016