![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE International Symposium on Optoelectronic Technology and Application 2016 - Beijing, China (Monday 9 May 2016)] Optical Measurement Technology and Instrumentation - Status of astigmatism-corrected Czerny-Turner spectrometers
Li, Xinhang, Han, Sen, Tan, JiuBin, Dong, Keyan, An, Yan, Wang, ZhenyeVolume:
10155
Year:
2016
Language:
english
DOI:
10.1117/12.2244265
File:
PDF, 301 KB
english, 2016