X-ray photoelectron spectroscopy study of highly-doped...

Journal of Alloys and Compounds 2017 / 10 Vol. 722

X-ray photoelectron spectroscopy study of highly-doped ZnO:Al,N films grown at O-rich conditions

Ievtushenko, A., Khyzhun, O., Shtepliuk, I., Bykov, O., Jakieła, R., Tkach, S., Kuzmenko, E., Baturin, V., Karpenko, О., Olifan, O., Lashkarev, G.
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Volume:
722
Language:
english
Journal:
Journal of Alloys and Compounds
DOI:
10.1016/j.jallcom.2017.06.169
Date:
October, 2017
File:
PDF, 968 KB
english, 2017
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