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[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - Predictive TCAD for NBTI stress-recovery in various device architectures and channel materials
Mishra, Subrat, Wong, Hiu Yung, Tiwari, Ravi, Chaudhary, Ankush, Parihar, Narendra, Rao, Rakesh, Motzny, Steve, Moroz, Victor, Mahapatra, SouvikYear:
2017
Language:
english
DOI:
10.1109/IRPS.2017.7936335
File:
PDF, 3.67 MB
english, 2017