[IEEE 2016 IEEE International Conference on Microwave and Millimeter Wave Technology (ICMMT) - Beijing, China (2016.6.5-2016.6.8)] 2016 IEEE International Conference on Microwave and Millimeter Wave Technology (ICMMT) - Microwave dielectric characterisation of SiO2 thin films through a single MIM test structure
Zhen Qin,, Wenbin Chen,, Xiaolei Wang,, Daoguo Yang,, Miao Cai,, Minghui Yun,Year:
2016
Language:
english
DOI:
10.1109/icmmt.2016.7761724
File:
PDF, 1.13 MB
english, 2016