[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - The complete time/temperature dependence of I-V drift in PCM devices
Le Gallo, Manuel, Sebastian, Abu, Krebs, Daniel, Stanisavljevic, Milos, Eleftheriou, EvangelosYear:
2016
Language:
english
DOI:
10.1109/irps.2016.7574617
File:
PDF, 640 KB
english, 2016