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Patent Citations Analysis and Its Value in Research Evaluation: A Review and a New Approach to Map Technology-relevant Research
van Raan, Anthony F.J.Volume:
2
Language:
english
Journal:
Journal of Data and Information Science
DOI:
10.1515/jdis-2017-0002
Date:
January, 2017
File:
PDF, 10.36 MB
english, 2017