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[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - Effect of passivation annealing on the electromigration properties of hybrid bonding stack

Jourdon, J., Moreau, S., Bouchu, D., Lhostis, S., Bresson, N., Guiheux, D., Beneyton, R., Renard, S., Fremont, H.
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Year:
2017
Language:
english
DOI:
10.1109/IRPS.2017.7936378
File:
PDF, 1.39 MB
english, 2017
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