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[IEEE 2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2017.4.24-2017.4.27)] 2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Design space exploration with a cycle-accurate systemC/TLM DRAM controller model
Ting-Shuo Hsu,, Chao-Chih Wu,, Che-Wei Hsu,, Chih-Tsun Huang,, Jing-Jia Liou,, Yao-Hua Chen,, Juin-Ming Lu,Year:
2017
Language:
english
DOI:
10.1109/VLSI-DAT.2017.7939674
File:
PDF, 532 KB
english, 2017