[IEEE 2016 17th International Conference on Electronic...

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[IEEE 2016 17th International Conference on Electronic Packaging Technology (ICEPT) - Wuhan, China (2016.8.16-2016.8.19)] 2016 17th International Conference on Electronic Packaging Technology (ICEPT) - Phase field simulation of morphological evolution and migration of the microvoid in small scale solder interconnects driven by temperature gradient

Liang, Shui-Bao, Ke, Chang-Bo, Zhou, Min-Bo, Zhang, Xin-Ping
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Year:
2016
Language:
english
DOI:
10.1109/icept.2016.7583286
File:
PDF, 964 KB
english, 2016
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