[IEEE 2016 5th International Symposium on Next-Generation...

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[IEEE 2016 5th International Symposium on Next-Generation Electronics (ISNE) - Hsinchu, Taiwan (2016.5.4-2016.5.6)] 2016 5th International Symposium on Next-Generation Electronics (ISNE) - Thermal resistance analysis of micro channel structure with 1D and Q2D methods

Chen, Shao-Wen, Liu, Fang-Chin, Kuo, Feng-Jiun, Chai, Min-Lun, Poh, Cai-Shi, Lee, Jin-Der, Wang, Jong-Rong, Lin, Hao-Tzu, Lin, Wei-Keng, Shih, Chunkuan
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Year:
2016
Language:
english
DOI:
10.1109/isne.2016.7543339
File:
PDF, 522 KB
english, 2016
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